Exploring the usage of diffusion models for thermal image super-resolution: a generic, uncertainty-aware approach for guided and non-guided schemes

Published in the proceedings of IEEE/CVF Conference on Computer Vision and Pattern Recognition, CVPR 2024 - Workshops, Seattle, WA, USA, June 17-18, 2024, 2024

Recommended citation: Carlos Cort{\'{e}}s{-}Mendez, Jean{-}Bernard Hayet, "Exploring the usage of diffusion models for thermal image super-resolution: a generic, uncertainty-aware approach for guided and non-guided schemes." the proceedings of IEEE/CVF Conference on Computer Vision and Pattern Recognition, CVPR 2024 - Workshops, Seattle, WA, USA, June 17-18, 2024, 2024. https://doi.org/10.1109/CVPRW63382.2024.00318